Automatic test systems: Difference between revisions
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In order to be able to directly control automats for electrical in-circuit function tests (flying probe Testers), TARGET 3001! offers the formats:<br><br> | In order to be able to directly control automats for electrical in-circuit function tests (flying probe Testers), TARGET 3001! offers the formats:<br><br> | ||
<nowiki>*</nowiki>.ipc IPC-D-356 | <nowiki>*</nowiki>.ipc IPC-D-356<br> | ||
<nowiki>*</nowiki>.tgr ([http://www.polarinstruments.com Polar Instruments]) | <nowiki>*</nowiki>.tgr ([http://www.polarinstruments.com Polar Instruments])<br> | ||
<nowiki>*</nowiki>.dif ([ | <nowiki>*</nowiki>.dif ([https://www.digitaltest.com/en/ Digitaltest])<br> | ||
<nowiki>*</nowiki>.fab (Fabmaster) | <nowiki>*</nowiki>.fab (Fabmaster)<br> | ||
<nowiki>*</nowiki>.txt (describes positions of test points for placing test probes) | <nowiki>*</nowiki>.txt (describes positions of test points for placing test probes)<br> | ||
<br> | <br><br> | ||
Each individual signal-carrying [[element]] of your [[board]] can be tested with the entire range of applications of the respective system. To generate these formats, select for example from | Each individual signal-carrying [[element]] of your [[board]] can be tested with the entire range of applications of the respective system. To generate these formats, select for example from:<br><br><br> | ||
[[Image:e_eTest.jpg|none]]Image<br><br> | [[Image:e_eTest.jpg|none]]Image<br><br> | ||
or<br><br><br><br> | or<br><br><br><br> | ||
[[Image:e_eTest1.jpg|none]]Image<br><br> | [[Image:e_eTest1.jpg|none]]Image<br><br> | ||
"What about [[ODB++]]?"<br><br> | |||
Examples of machines doing the job:<br><br> | Examples of machines doing the job:<br><br> | ||
Latest revision as of 14:49, 12 February 2021
In order to be able to directly control automats for electrical in-circuit function tests (flying probe Testers), TARGET 3001! offers the formats:
*.ipc IPC-D-356
*.tgr (Polar Instruments)
*.dif (Digitaltest)
*.fab (Fabmaster)
*.txt (describes positions of test points for placing test probes)
Each individual signal-carrying element of your board can be tested with the entire range of applications of the respective system. To generate these formats, select for example from:
Image
or
Image
"What about ODB++?"
Examples of machines doing the job:
.