Documentation

Difference between revisions of "Automatic test systems"

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Each individual signal-carrying [[element]] of your [[board]] can be tested with the entire range of applications of the respective system. To generate these formats, select for example from [[Menu File]] / [[Input/Output Formats]] / [[Test adapter]] / ...<br><br><br>
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Each individual signal-carrying [[element]] of your [[board]] can be tested with the entire range of applications of the respective system. To generate these formats, select for example from:<br><br><br>
  
 
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Revision as of 14:48, 12 February 2021

In order to be able to directly control automats for electrical in-circuit function tests (flying probe Testers), TARGET 3001! offers the formats:

*.ipc IPC-D-356
*.tgr (Polar Instruments)
*.dif (Digitaltest)
*.fab (Fabmaster)
*.txt (describes positions of test points for placing test probes)


Each individual signal-carrying element of your board can be tested with the entire range of applications of the respective system. To generate these formats, select for example from:


E eTest.jpg
Image

or



E eTest1.jpg
Image

"What about ODB++?"

Examples of machines doing the job:



.